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Intelligent condition monitoring and diagnosis systems : a computational intelligence approach /

Wang, Keshen

Intelligent condition monitoring and diagnosis systems : a computational intelligence approach / Kesheng Wang - Amsterdam, The Netherlands: IOS Press, 2003 - x, 122 p.: ill.; 24 cm.

Includes bibliographical references and index

ISBN: 1586033123

Subjects--Topical Terms:
Expert systems (Computer science)--Industrial applications
Machinery--Testing

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