Optimal reliability design : fundamentals and applications /
Optimal reliability design : fundamentals and applications /
Way Kuo ... [et al.]
- New York: Cambridge University Press, 2001
- xx, 389 p.: ill.; 26 cm.
Includes bibliographical references (p. [367]-384) and index
0521781272
Reliability (Engineering)
Includes bibliographical references (p. [367]-384) and index
0521781272
Reliability (Engineering)