Normal view MARC view ISBD view

Extended defects in semiconductors : electronic properties, device effects and structures /

Holt, D. B.

Extended defects in semiconductors : electronic properties, device effects and structures / D.B. Holt, B.G. Yacobi - Cambridge ; New York : Cambridge University Press, 2007 - xi, 631 p. : ill. ; 26 cm.

Includes bibliographical references and index

ISBN: 0521819342 (hbk.) 9780521819343 (hbk.)

Subjects--Topical Terms:
Semiconductors--Defects

Place hold
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)