Fundamentals of powder diffraction and structural characterization of materials /
Pecharsky, Vitalij K.
Fundamentals of powder diffraction and structural characterization of materials / Vitalij K. Pecharsky, Peter Y. Zavalij - 2nd ed. - New York : Springer, c2009 - xxiii, 741 p. : ill. ; 24 cm.
Includes bibliographical references and index
9780387095783 (pbk.)
X-rays--Diffraction--Measurement
Powders--Optical properties--Measurement
X-ray crystallography
Fundamentals of powder diffraction and structural characterization of materials / Vitalij K. Pecharsky, Peter Y. Zavalij - 2nd ed. - New York : Springer, c2009 - xxiii, 741 p. : ill. ; 24 cm.
Includes bibliographical references and index
9780387095783 (pbk.)
X-rays--Diffraction--Measurement
Powders--Optical properties--Measurement
X-ray crystallography