Trace analysis with nanomaterials /
Trace analysis with nanomaterials /
edited by David T. Pierce and Julia Xiaojun Zhao
- Weinheim, Germany : Wiley-VCH Verlag GmbH , 2009
- xxi, 396 p. : ill. (some col.) ; 25 cm.
Includes bibliographical references and index
3527323503 9783527323500
Trace analysis
Nanostructured materials
Includes bibliographical references and index
3527323503 9783527323500
Trace analysis
Nanostructured materials