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Measurement and modeling of silicon heterostructure devices /

Measurement and modeling of silicon heterostructure devices / edited by John D. Cressler - Boca Raton, FL : CRC Press, c2008 - 1 v. (various pagings) : ill. ; 27 cm.

Includes bibliographical references and index

ISBN: 9781420066920 (alk. paper) 1420066927 (alk. paper)

Subjects--Topical Terms:
Bipolar transistors--Mathematical models
Bipolar transistors
Heterostructures
Integrated circuits--Design and construction

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