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Advanced nondestructive evaluation II : proceedings of the International Conference on ANDE 2007, the 2nd International Conference on Advanced Nondestructive Testing /

Advanced nondestructive evaluation II : proceedings of the International Conference on ANDE 2007, the 2nd International Conference on Advanced Nondestructive Testing / editors, Seung-Seok Lee ... [et al.] - Singapore ; Hackensack, N.J. : World Scientific, c2008 - 2 v. : ill. ; 24 cm.

Includes bibliographical references

ISBN: 9789812790163 (set) 9812790160 (set) 9789812790170 (vol. 1) 9812790179 (vol. 1) 9789812790187 (vol. 2) 9812790187 (vol. 2)

Subjects--Topical Terms:
Nondestructive testing--Congresses
Materials science--Congresses

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