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X-Rays in nanoscience : spectroscopy, spectromicroscopy, and scattering techniques /

X-Rays in nanoscience : spectroscopy, spectromicroscopy, and scattering techniques / edited by Jinghua Guo - Weinheim, GER : Wiley-VCH, 2010 - xii, 263 p. : ill. ; 25 cm.

Includes bibliographical references and index

ISBN: 9783527322886 3527322884

Subjects--Topical Terms:
Nanostructured materials
X-ray microanalysis

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