Atomic force microscopy based nanorobotics : modelling, simulation, setup building and experiments /
Atomic force microscopy based nanorobotics : modelling, simulation, setup building and experiments /
Hui Xie ... [et al.]
- Berlin : Springer, c2011
- xiv, 342 p. : ill. (some col.) ; 24 cm.
- Springer tracts in advanced robotics, v. 71 1610-7438 ; .
- Springer tracts in advanced robotics ; v. 71 .
Includes bibliographical references
Introduction -- Descriptions and Challenges of AFM Based Nanorobotic Systems -- Instrumentation Issues of an AFM Based Nanorobotic System -- Nanomechanics of AFM Based Nanomanipulation -- Teleoperation Based AFM Manipulation Control -- Automated Control of AFM Based Nanomanipulation -- Applications of AFM Based Nanorobotic Systems
9783642203282 3642203280 9783642203299 (electronic bk.) 3642203299 (electronic bk.)
Robotics
Microrobots
Atomic force microscopy
Includes bibliographical references
Introduction -- Descriptions and Challenges of AFM Based Nanorobotic Systems -- Instrumentation Issues of an AFM Based Nanorobotic System -- Nanomechanics of AFM Based Nanomanipulation -- Teleoperation Based AFM Manipulation Control -- Automated Control of AFM Based Nanomanipulation -- Applications of AFM Based Nanorobotic Systems
9783642203282 3642203280 9783642203299 (electronic bk.) 3642203299 (electronic bk.)
Robotics
Microrobots
Atomic force microscopy