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Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. /

Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. / editors by William F. Filter ... [et al.] - Pittsburgh, PA : Materials Research Society, c1996 - xv, 583 p. : ill. ; 24 cm. - Materials Research Society symposium proceedings ; v. 428 . - Materials Research Society symposium proceedings .

Includes bibliographical references and index

ISBN: 9781558993310 1558993312

Subjects--Topical Terms:
Microelectronics--Reliability--Congresses
Microelectronics--Materials--Testing--Congresses
Microstructure--Congresses--Congresses
Metallizing--Congresses

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