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Chi-squared goodness of fit tests with applications /

Voinov, Vassiliy

Chi-squared goodness of fit tests with applications / V. Voinov, M. Nikulin, N. Balakrishnan - Amsterdam : Elsevier/AP, 2013 - xii, 229 p. : ill. ; 24 cm.

Includes bibliographical references and index

ISBN: 9780123971944 (hardback)

Subjects--Topical Terms:
Chi-square test
Distribution (Probability theory)

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