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Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. /

Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. / editors, Michael Mastro ... [et al.] - Warrendale, PA : Materials Research Society, 2009 - xiii, 259 p. : ill. ; 24 cm. - Materials Research Society symposium proceedings ; v. 1108 . - Materials Research Society symposia proceedings ; v. 1108 .

Includes bibliographical references and indexes

ISBN: 9781605110806 1605110809

Subjects--Topical Terms:
Semiconductors--Congresses
Semiconductors--Defects--Congresses
Semiconductors--Reliability--Congresses

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