Normal view MARC view ISBD view

Ion beam analysis : fundamentals and applications /

Nastasi, Michael Anthony, 1950-

Ion beam analysis : fundamentals and applications / Michael Nastasi, James W. Mayer, Yongqiang Wang - Boca Raton, FL : CRC Press, 2015 - xxi, 450 p. : ill. ; 24 cm.

Includes bibliographical references and index

ISBN: 9781439846384 (hbk.)

Subjects--Topical Terms:
Ion bombardment

Place hold
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)