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X-ray diffraction for materials research : from fundamentals to applications /

Lee, Myeongkyu

X-ray diffraction for materials research : from fundamentals to applications / Myeongkyu Lee - Oakville, ON, Canada ; Waretown, NJ, USA : Apple Academic Press, 2016 - xii, 289 p. : ill. ; 24 cm.

Includes bibliographical references and index

ISBN: 9781771882989 (hbk.) 1771882980

Subjects--Topical Terms:
X-rays--Diffraction
Materials--Research

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