Normal view MARC view ISBD view

Semiconductor material and device characterization /

Semiconductor material and device characterization / contributors: Wei Du, Feng Zhao, et al. - ix, 200 pages : illustration ; 31 cm

Includes bibliographical references and index

ISBN: 9781788021487 1788021487

Subjects--Topical Terms:
Semiconductors.
Semiconductors--Testing.

Place hold
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)