Defects in microelectronic materials and devices / (Record no. 44378)

MARC details
000 -LEADER
fixed length control field 01182nam a2200277 a 4500
001 - CONTROL NUMBER
control field vtls000035825
003 - CONTROL NUMBER IDENTIFIER
control field KUKTEM
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251117145339.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 090430t2009 flua f 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781420043761
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description 201107132122
Level of effort used to assign nonsubject heading access points VLOAD
Level of effort used to assign subject headings 200910271609
Level of effort used to assign classification sri
Level of effort used to assign subject headings 200908141608
Level of effort used to assign classification VLOAD
Level of effort used to assign subject headings 200908141541
Level of effort used to assign classification VLOAD
-- 200904301507
-- nadia
040 ## - CATALOGING SOURCE
Original cataloging agency UMP
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) TK7871 .F54 2009
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Fleetwood, Daniel M.
245 10 - TITLE STATEMENT
Title Defects in microelectronic materials and devices /
Statement of responsibility, etc. edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Boca Raton :
Name of publisher, distributor, etc. CRC Press,
Date of publication, distribution, etc. 2009
300 ## - PHYSICAL DESCRIPTION
Extent xvi, 753 p. :
Other physical details ill. ;
Dimensions 26 cm.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microelectronics
General subdivision Materials
-- Testing
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metal oxide semiconductor field-effect transistors
General subdivision Testing
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Defects
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Pantelides, Sokrates T.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Schrimpf, Ronald Donald.
856 41 - ELECTRONIC LOCATION AND ACCESS
Materials specified Table of contents only
Uniform Resource Identifier <a href="http://www.loc.gov/catdir/toc/ecip0817/2008018722.html">http://www.loc.gov/catdir/toc/ecip0817/2008018722.html</a>
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Cost, normal purchase price Total checkouts Full call number Barcode Date last seen Copy number Cost, replacement price Price effective from Koha item type
  Not lost     UMPLIB PEKAN UMPLIB PEKAN 04/09/2019 558.60   TK7871 .F54 2009 0000041365 04/09/2019 1 558.60 04/09/2019 Open Shelf

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