Effect of different cooling rate on integrated circuit (ic) package / (Record no. 5764)

MARC details
000 -LEADER
fixed length control field 02474ntm a2200253 a 4500
001 - CONTROL NUMBER
control field vtls000083730
003 - CONTROL NUMBER IDENTIFIER
control field KUKTEM
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251117113251.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 141119t2013 my a f m 000 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number THE0006913(Local)
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description 201906131042
Level of effort used to assign nonsubject heading access points aida
-- 201411191721
-- fawwaz
040 ## - CATALOGING SOURCE
Original cataloging agency UMP
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) TK7871.85 .A45 2013 r Bc.
100 0# - MAIN ENTRY--PERSONAL NAME
Personal name Amir Syahmi Nordin
245 10 - TITLE STATEMENT
Title Effect of different cooling rate on integrated circuit (ic) package /
Statement of responsibility, etc. Amir Syahmi Nordin
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Kuantan, Pahang :
Name of publisher, distributor, etc. UMP,
Date of publication, distribution, etc. 2013
300 ## - PHYSICAL DESCRIPTION
Extent xvii, 56 p. :
Other physical details ill. ;
Dimensions 30 cm. +
Accompanying material 1 CD-ROM
502 ## - DISSERTATION NOTE
Dissertation note Project paper (Bachelor of Mechanical Engineering (Automotive) -- Universiti Malaysia Pahang - 2013
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Bibliography : p. 53-55
520 3# - SUMMARY, ETC.
Summary, etc. Currently, electronic products have shrunk into smaller size and in order to increase the input/output (I/O) counts as well as to improve performance. The goal of this study is to determine the reliability and strength of the solder joint formed at the integrated circuit (IC) interconnection with the board. The strength of the joint is based on the intermetallic compound (IMC) formation at the joint. Free lead based solders have been used nowadays due to the environmental and health hazard effect of the lead based solder. Two types of surface finish have been used in this study which was electroless/nickel immersion gold (ENIG) and bare copper substrate as the reference in the research. All specimens will be subjected to reflow soldering with slow and fast cooling rate apply on the sample. Then, all specimens will undergo isothermal ageing at 150°C for 250 hour and 500 hour. The IMC formed at the solder joints of all specimens were studied in terms of thickness and cooling rate applied on it. Characterization on the specimen is done by the cross section of the joint to see the IMC formation on the solder joint. It can be concluded that, the fast cooling rate forms large IMC compared to slow cooling rate which is much thinner than fast cooling rate. Besides that, it was found that IMCs thicknesses are proportional with ageing durations. However, thicker IMC was found on the bare copper substrate joint compare to ENIG surface joint after ageing treatment, indicating higher growth rate of IMCs formed at the bare cooper substrate
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type
  Not lost   Not for loan UMPLIB PEKAN UMPLIB PEKAN 04/09/2019   TK7871.85 .A45 2013 r Bc. 0000086180 04/09/2019 1 04/09/2019 Final Year Report
  Not lost   Not for loan UMPLIB PEKAN UMPLIB PEKAN 04/09/2019   CD 8031 | TK7871.85 .A45 2013 r Bc. 0000086181 04/09/2019 1 04/09/2019 Final Year Report

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