MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01292nam a2200289 a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
vtls000043606 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
KUKTEM |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20251117150440.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
090909t2005 sz a f 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
3908451132 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783908451136 |
| 039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE] |
|---|
| Level of rules in bibliographic description |
201107132249 |
| Level of effort used to assign nonsubject heading access points |
VLOAD |
| Level of effort used to assign subject headings |
201104191429 |
| Level of effort used to assign classification |
ida |
| -- |
200909091035 |
| -- |
faiz |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
UMP |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
|---|
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TK7871.85 .A98 2005 |
| 111 2# - MAIN ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" |
| Number of part/section/meeting |
(11th : |
| Date of meeting or treaty signing |
2005 : |
| Location of meeting |
Giens, France) |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Proceeding of the 11th International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology : |
| Remainder of title |
GADEST 2005, Giens, France, September 25-30, 2005 |
| 246 3# - VARYING FORM OF TITLE |
|---|
| Title proper/short title |
Gettering and Defect Engineering in Semiconductor Technology |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Uetikon-Zurich, Switzerland : |
| Name of publisher, distributor, etc. |
Trans Tech Pub., |
| Date of publication, distribution, etc. |
c2005 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xvi, 814 p. : |
| Other physical details |
ill. ; |
| Dimensions |
25 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references and index |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Getters |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Silicon crystals |
| General subdivision |
Defects |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electrical engineering |
| General subdivision |
Materials |
| Form subdivision |
Congresses |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Pichaud, B. |