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Mathematical models for systems reliability / Benjamin Epstein and Ishay Weissman

By: Contributor(s): Material type: TextTextPublication details: Boca Raton : CRC Press , c2008Description: 253 p. : ill. ; 25 cmISBN:
  • 9781420080827
Subject(s):
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Open Shelf Open Shelf UMPLIB GAMBANG TA169 .E67 2008 (Browse shelf(Opens below)) 1 Available 0000047224

"A Chapman & Hall book."

Includes bibliographical references and index

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