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Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A. / editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham
Material type:
TextSeries: Materials Research Society symposia proceedings ; v. 208Publication details: Pittsburgh, Pa. : Materials Research Society, c1991Description: xiii, 367 p. : ill. ; 24 cmISBN: - 9781558991002
- 155899100X
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Open Shelf
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UMPLIB GAMBANG | QC176.84.S93 A38 1991 (Browse shelf(Opens below)) | 1 | Available | 0000068342 |
Includes bibliographical references and index