Semiconductor process reliability in practice / Gan, Zhenghao, Wong Waisum and Liou Juin

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Material type: Text

TextPublication details: New York : McGraw-Hill, 2013Description: xv, 605 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TK7871.85 .G36 2013 (Browse shelf(Opens below))	1	Available		0000080138

Includes bibliographical references and index