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Nonlinear transistor model parameter extraction techniques / edited by Matthias Rudolph, Christian Fager, David E. Root
Material type:
TextSeries: The Cambridge RF and microwave engineering seriesPublication details: New York : Cambridge University Press, 2012Description: xiv, 352 p. : ill. ; 26 cmISBN: - 9780521762106
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Open Shelf
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UMPLIB PEKAN | TK7871.9 .N66 2012 (Browse shelf(Opens below)) | 1 | Available | 0000092543 |
Includes bibliographical references and index