Yield-aware analog IC design and optimization in nanometer-scale technologies / by António Manuel Lourenço Canelas, Jorge Manuel Correia Guilherme, Nuno Cavaco Gomes Horta
Material type:
TextPublisher: Cham : Springer, 2020Copyright date: © 2020Description: 1 online resourceContent type: - text
- computer
- online resource
- 9783030415365
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
E-book
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UMPLIB PEKAN | Non-fiction | TK7874 .C36 2020 (Browse shelf(Opens below)) | 1 | Available | E000001698 |