01368ngm a2200217   4500001001400000003000700014005001700021008004100038020002200079040000800101245017800109260006900287300005700356490002700413500003200440520052100472538006000993650004201053650002801095830002701123vtls000081583KUKTEM20251117141042.0140703t2009    miu33  g      s0  vceng    aMED0000534(Local)  aUMP00aNanometrologyh[video recording]:bDVO8PUB12 /cproduced by Society of  Manufacturing Engineers ; producer/director/editor, David Rembiesa ; written by Tihamer T. Toth-Fejel  b[Dearborne, Mich.] :bSociety of Manufacturing Engineers,cc2009  a1 digital video disc (DVD) (33min.):bcolor ;c12cm.1 aManufacturing insights  aLibrary internal view only.  aLearn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the  S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy)  aDisc compatible with computer DVD drive and DVD player. 0aNanostructured materialsxMeasurement 0aMicroscopyxMeasurement 0aManufacturing insights