01618ngm a2200265 4500 vtls000081583 KUKTEM 20251117141042.0 140703t2009 miu33 g s0 vceng MED0000534(Local) 201905271148 nazri 201412021043 iswan 201407031438 nadia UMP dvd QC39 .N36 2009 Nanometrology [video recording]: DVO8PUB12 / produced by Society of Manufacturing Engineers ; producer/director/editor, David Rembiesa ; written by Tihamer T. Toth-Fejel [Dearborne, Mich.] : Society of Manufacturing Engineers, c2009 1 digital video disc (DVD) (33min.): color ; 12cm. Manufacturing insights Library internal view only. Learn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy) Disc compatible with computer DVD drive and DVD player. Nanostructured materials Measurement Microscopy Measurement Manufacturing insights 0 0 0 1 20000 20000 2019-09-04 704.86 0 dvd QC39 .N36 2009 0000089021 2019-09-04 00:00:00 1 704.86 2019-09-04 CD_DVD VIRTUA4 10578 10584 VTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*5000*5200*5380*6500*6501*8300*9992