Defect and microstructure analysis by diffraction / 
[edited by] Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge 
 - Oxford; New York:  Oxford University Press,  1999 
 - xxii, 785 p.:  ill.;  24 cm. 
 - International Union of Crystallography monographs on crystallography; 10 .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0198501897 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystals--Defects--Analysis<br/>Diffraction<br/>X-ray crystallography