00926nam a2200253 4500 vtls000002686 KUKTEM 20251117142011.0 0198501897 201107131644 VLOAD 200908141005 VLOAD 200908140938 VLOAD 200908131505 VLOAD 200606141109 VLOAD UMP QD945 .D43 1999 Defect and microstructure analysis by diffraction / [edited by] Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge Oxford; New York: Oxford University Press, 1999 xxii, 785 p.: ill.; 24 cm. International Union of Crystallography monographs on crystallography; 10 Includes bibliographical references and index Crystals Defects Analysis Diffraction X-ray crystallography Snyder, Robert L. Fiala, Jaroslav Bunge, Hans J. 0 0 lcc 0 0 10000 10000 2019-09-04 1260.00 0 QD945 .D43 1999 0000009438 2019-09-04 00:00:00 1260.00 2019-09-04 OPEN 20398 20404