TY  - BOOK
AU  - Snyder,Robert L.
AU  - Fiala,Jaroslav
AU  - Bunge,Hans J.
TI  - Defect and microstructure analysis by diffraction
SN  - 0198501897
PY  - 1999///
CY  - Oxford; New York
PB  - Oxford University Press
KW  - Crystals
KW  - Defects
KW  - Analysis
KW  - Diffraction
KW  - X-ray crystallography
N1  - Includes bibliographical references and index
ER  -