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  <titleInfo>
    <title>Correlation spectroscopy of surfaces, thin films, and nanostructures</title>
  </titleInfo>
  <name type="personal">
    <namePart>Berakdar, Jamal</namePart>
  </name>
  <name type="personal">
    <namePart>Kirschner, Jurgen</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">Weinheim, Germany</placeTerm>
    </place>
    <publisher>Wiley-VCH</publisher>
    <dateIssued>2004</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <physicalDescription>
    <extent>xvii, 238 p.: ill.; 25 cm.</extent>
  </physicalDescription>
  <note type="statement of responsibility">edited by Jamal Berakdar, Jurgen Kirschner</note>
  <note>Includes bibliographical references and index</note>
  <subject authority="lcsh">
    <topic>Surfaces (Physics)</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Nanostructures</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Thin films</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Spectrum analysis</topic>
  </subject>
  <identifier type="isbn">3527404775</identifier>
  <recordInfo>
    <recordContentSource authority="marcorg">UMP</recordContentSource>
    <recordChangeDate encoding="iso8601">20251117142016.0</recordChangeDate>
    <recordIdentifier source="KUKTEM">vtls000002457</recordIdentifier>
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