Wang, Keshen <br/><br/>
Intelligent condition monitoring and diagnosis systems :   a computational intelligence approach / 
Kesheng Wang 
 - Amsterdam, The Netherlands:   IOS Press,   2003 
 - x, 122 p.:   ill.;   24 cm. 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>1586033123 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Expert systems (Computer science)--Industrial applications<br/>Machinery--Testing