00884nam a2200253 a 4500 vtls000007663 KUKTEM 20251117142212.0 060606t2005 nyua f 001 0 eng d 0072825383 0071246827 9780072825381 201206221113 asmadi 201206211114 asmadi 201107131727 VLOAD 200908141057 VLOAD 200606141135 VLOAD UMP QC39 .D86 2005 Dunn, Patrick F. Measurement and data analysis for engineering and science / Patrick F. Dunn New York, NY : McGraw Hill , 2005 xix, 540 p. : ill. ; 26 cm. Includes index Physical measurements Textbooks Statistic Textbooks 0 0 0 0 20000 20000 2019-09-04 573.12 0 QC39 .D86 2005 0000011722 2019-09-04 00:00:00 1 573.12 2019-09-04 OPEN 0 0 0 0 10000 10000 2019-09-04 573.12 0 QC39 .D86 2005 0000021240 2019-09-04 00:00:00 2 573.12 2019-09-04 OPEN c. 2 0 0 0 0 10000 10000 2019-09-04 573.12 0 QC39 .D86 2005 0000021241 2019-09-04 00:00:00 3 573.12 2019-09-04 OPEN c. 3 VIRTUA40 24461 24467 VTLSSORT0080*0200*0201*0202*0400*0900*1000*2450*2600*3000*5000*6500*6501*9991