Optimal reliability design :   fundamentals and applications / 
Way Kuo ... [et al.] 
 - New York:   Cambridge University Press,   2001 
 - xx, 389 p.:   ill.;   26 cm. 
<br/><br/>Includes bibliographical references (p. [367]-384) and index 
<br/><br/><label>ISBN: </label>0521781272 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability (Engineering)