Sato, Yoshihiko <br/><br/>
Value analysis tear-down :   a new process for product development and innovation / 
Yoshihiko Sato and J. Jerry Kaufman 
 - New York:    Industrial Press,   2005 
 - x, 206 p.:   ill.;   24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0831132035 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Value analysis (Cost control)<br/>Industrial productivity<br/>New products<br/>Engineering economy