00716nam a2200217   4500001001400000003000700014005001700021008004100038020001500079040000800094100002000102245012600122260004200248300003200290504005100322650003400373650002800407650001700435650002400452700002200476vtls000012322KUKTEM20251117142401.0060606t2004    xxu    gr    |0 1 0|eng |  a0831132035  aUMP  aSato, Yoshihiko00aValue analysis tear-down :b a new process for product development and innovation /c Yoshihiko Sato and J. Jerry Kaufman  aNew York: b Industrial Press,c 2005  ax, 206 p.:b ill.;c 24 cm.  aIncludes bibliographical references and index.00aValue analysis (Cost control)00aIndustrial productivity00aNew products00aEngineering economy12aKaufman, J. Jerry