00952nam a2200241 a 4500001001400000003000700014005001700021008004100038020001500079039010800094040000800202090002700210100002200237245008800259260005100347300003200398504005000430650004800480650003500528700002100563952010900584999001700693vtls000013941KUKTEM20251117142443.0060606t2004    xxk    gr    |0 1 0|eng |  a0521453739 9a201107131824bVLOADc200908141213dVLOADc200908141144dVLOADc200908131623dVLOADy200606280917zVLOAD  aUMP  aQC176.84.S93bI33 20041 aIchimiya, Ayahiko10aReflection high-energy electron diffraction /cAyahiko Ichimiya and Philip I. Cohen  aCambridge :bCambridge University Press,c2004  axi, 353 p. :bill.;c25 cm.  aIncludes bibliographical references and index00aReflection high energy electron diffraction00aThin filmsxSurfacesxAnalysis12aCohen, Philip I.  00104070a10000b10000d2019-09-04l0oQC176.84.S93p0000015538r2019-09-04 00:00:00w2019-09-04yOPEN  c29490d29496