<?xml version="1.0" encoding="UTF-8"?>
<record
    xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"
    xsi:schemaLocation="http://www.loc.gov/MARC21/slim http://www.loc.gov/standards/marcxml/schema/MARC21slim.xsd"
    xmlns="http://www.loc.gov/MARC21/slim">

  <leader>00988nam a2200253 a 4500</leader>
  <controlfield tag="001">vtls000017449</controlfield>
  <controlfield tag="003">KUKTEM</controlfield>
  <controlfield tag="005">20251117144236.0</controlfield>
  <controlfield tag="008">070116                       000 0 eng d</controlfield>
  <datafield tag="020" ind1=" " ind2=" ">
    <subfield code="a">1402075898</subfield>
  </datafield>
  <datafield tag="039" ind1=" " ind2="9">
    <subfield code="a">201107131856</subfield>
    <subfield code="b">VLOAD</subfield>
    <subfield code="c">200908141253</subfield>
    <subfield code="d">VLOAD</subfield>
    <subfield code="c">200908141225</subfield>
    <subfield code="d">VLOAD</subfield>
    <subfield code="c">200908131647</subfield>
    <subfield code="d">VLOAD</subfield>
    <subfield code="y">200701161538</subfield>
    <subfield code="z">kam</subfield>
  </datafield>
  <datafield tag="040" ind1=" " ind2=" ">
    <subfield code="a">UMP</subfield>
  </datafield>
  <datafield tag="090" ind1=" " ind2=" ">
    <subfield code="a">TK7895.E42 F38 2003</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
    <subfield code="a">Fault injection techniques and tools for embedded systems reliability evaluation /</subfield>
    <subfield code="c">edited by Alfredo Benso and Paolo Prinetto</subfield>
  </datafield>
  <datafield tag="260" ind1=" " ind2=" ">
    <subfield code="a">Boston :</subfield>
    <subfield code="b">Kluwer Academic Pub.,</subfield>
    <subfield code="c">2003</subfield>
  </datafield>
  <datafield tag="300" ind1=" " ind2=" ">
    <subfield code="a">241 p. :</subfield>
    <subfield code="b">ill. ;</subfield>
    <subfield code="c">25 cm.</subfield>
  </datafield>
  <datafield tag="440" ind1=" " ind2="0">
    <subfield code="a">Frontiers in electronic testing ;</subfield>
    <subfield code="v">23</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Embedded computer systems</subfield>
    <subfield code="x">Testing</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Embedded computer systems</subfield>
    <subfield code="x">Reliability</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
    <subfield code="a">Fault location (Engineering)</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
    <subfield code="a">Benso, Alfredo</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
    <subfield code="a">Prinetto, Paolo</subfield>
  </datafield>
  <datafield tag="952" ind1=" " ind2=" ">
    <subfield code="0">0</subfield>
    <subfield code="1">0</subfield>
    <subfield code="2">lcc</subfield>
    <subfield code="4">0</subfield>
    <subfield code="7">0</subfield>
    <subfield code="a">20000</subfield>
    <subfield code="b">20000</subfield>
    <subfield code="d">2019-09-04</subfield>
    <subfield code="g">624.99</subfield>
    <subfield code="l">0</subfield>
    <subfield code="o">TK7895.E42 F38 2003</subfield>
    <subfield code="p">0000019401</subfield>
    <subfield code="r">2019-09-04 00:00:00</subfield>
    <subfield code="t">1</subfield>
    <subfield code="v">624.99</subfield>
    <subfield code="w">2019-09-04</subfield>
    <subfield code="y">OPEN</subfield>
  </datafield>
  <datafield tag="999" ind1=" " ind2=" ">
    <subfield code="a">VIRTUA40</subfield>
    <subfield code="c">32269</subfield>
    <subfield code="d">32275</subfield>
  </datafield>
  <datafield tag="999" ind1=" " ind2=" ">
    <subfield code="a">VTLSSORT0080*0200*0900*2450*2600*3000*4400*6500*6501*6502*7000*7001*9991</subfield>
  </datafield>
</record>
