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  <titleInfo>
    <title>Fault injection techniques and tools for embedded systems reliability evaluation</title>
  </titleInfo>
  <name type="personal">
    <namePart>Benso, Alfredo</namePart>
  </name>
  <name type="personal">
    <namePart>Prinetto, Paolo</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">Boston</placeTerm>
    </place>
    <publisher>Kluwer Academic Pub.</publisher>
    <dateIssued>2003</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <language>
    <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
  </language>
  <physicalDescription>
    <form authority="marcform">print</form>
    <extent>241 p. : ill. ; 25 cm.</extent>
  </physicalDescription>
  <note type="statement of responsibility">edited by Alfredo Benso and Paolo Prinetto</note>
  <subject authority="lcsh">
    <topic>Embedded computer systems</topic>
    <topic>Testing</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Embedded computer systems</topic>
    <topic>Reliability</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Fault location (Engineering)</topic>
  </subject>
  <relatedItem type="series">
    <titleInfo>
      <title>Frontiers in electronic testing ; 23</title>
    </titleInfo>
  </relatedItem>
  <identifier type="isbn">1402075898</identifier>
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    <recordCreationDate encoding="marc">070116</recordCreationDate>
    <recordChangeDate encoding="iso8601">20251117144236.0</recordChangeDate>
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