VLSI test principles and architectures :  design for testability / 
edited by Laung-Tern Wang, Cheng-Wen Wu, Xiaoqing Wen 
 - San Fransisco, CA :  Morgan Kaufmann,  2006 
 - 777 p. :  ill. ;  24 cm. 
<br/><br/><label>ISBN: </label>0123705975 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing<br/>Integrated circuits--Very large scale integration--Design