00967nam a2200241 a 4500 vtls000020097 KUKTEM 20251117144330.0 070612t2006 caua f 000 0 eng d 0123705975 201207031141 Fida 201107131917 VLOAD 201105271101 Fida 200908141323 VLOAD 200706121422 training UMP TK7874.75 .V57 2006 VLSI test principles and architectures : design for testability / edited by Laung-Tern Wang, Cheng-Wen Wu, Xiaoqing Wen San Fransisco, CA : Morgan Kaufmann, 2006 777 p. : ill. ; 24 cm. Integrated circuits Very large scale integration Testing Integrated circuits Very large scale integration Design Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing 0 0 0 0 20000 20000 2019-09-04 0 TK7874.75 .V57 2006 0000023496 2019-09-04 00:00:00 1 2019-09-04 OPEN VIRTUA40 34158 34164 VTLSSORT0080*0200*0400*0900*2450*2600*3000*6500*6501*7000*7001*7002*9992