TY  - BOOK
AU  - Wang,Laung-Terng
AU  - Wu,Cheng-Wen
AU  - Wen,Xiaoqing
TI  - VLSI test principles and architectures: design for testability 
SN  - 0123705975
PY  - 2006///
CY  - San Fransisco, CA
PB  - Morgan Kaufmann
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Design
ER  -