Applied scanning probe methods II :  scanning probe microscopy techniques / 
Bharat Bhushan, Harald Fuchs (Eds.) 
 - Berlin ;  London :  Springer,  c2006 
 - xliii, 420 p. :  ill. ;  24 cm. 
 - Nanoscience and technology .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>3540262423 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy<br/>Scanning probe microscopy--Industrial applications<br/>Materials--Microscopy