01378nam a2200241 a 4500 vtls000022130 KUKTEM 20251117144402.0 071108s2003 xxk f 001 0 eng|d 0852969996 201107131930 VLOAD 200908141339 VLOAD 200908141311 VLOAD 200908131716 VLOAD 200711081546 kam UMP TK7878.4 .K45 2003 Kularatna, Nihal Digital and analogue instrumentation : testing and measurement / Nihal Kularatna London : IEE, 2003 645 p. : ill. ; 25 cm. IEE electrical measurement series ; v. 11 Introduction -- Enabling technologies -- Data converters -- Waveform parameters, multimeters and pulse techniques -- Fundamentals of oscilloscopes -- Recent developments on DSO techniques -- Electronic counters -- Conventional signal sources and arbitrary waveform generators -- Spectrum analysis -- Logic analysers -- An introduction to instrument buses and VLSI testing -- Transmission measurements -- Digital signal processors -- Sensors -- Calibration of instruments. Electronic instruments Testing http://www.loc.gov/catdir/enhancements/fy0651/2006284184-t.html 0 0 lcc 0 0 20000 20000 2019-09-04 609.21 0 TK7878.4 .K45 2003 0000024447 2019-09-04 00:00:00 1 609.21 2019-09-04 OPEN VIRTUA40 35244 35250 VTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*4400*5050*6500*8560*9991