testing and measurement Kularatna, Nihal creator text xxk London IEE 2003 monographic eng

print

645 p. : ill. ; 25 cm. Introduction -- Enabling technologies -- Data converters -- Waveform parameters, multimeters and pulse techniques -- Fundamentals of oscilloscopes -- Recent developments on DSO techniques -- Electronic counters -- Conventional signal sources and arbitrary waveform generators -- Spectrum analysis -- Logic analysers -- An introduction to instrument buses and VLSI testing -- Transmission measurements -- Digital signal processors -- Sensors -- Calibration of instruments. specialized Nihal Kularatna Electronic instruments Testing 0852969996 UMP 071108 20251117144402.0 vtls000022130