Emerging nanotechnologies :  test, defect tolerance, and reliability / 
[edited by] Mohammad Tehranipoor 
 - New York  :  Springer ,  2008 
 - xii, 405 p. :  ill. ;  25 cm. 
 - Frontiers in electronic testing ;  v. 37 .
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>9780387747460 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanotechnology