TY  - BOOK
AU  - Tehranipoor,Mohammad
TI  - Emerging nanotechnologies: test, defect tolerance, and reliability 
T2  - Frontiers in electronic testing
SN  - 9780387747460
PY  - 2008///
CY  - New York
PB  - Springer
KW  - Nanotechnology
N1  - Includes index
ER  -