Applied pattern recognition / 
Horst Bunke, Abraham Kandel, Mark Last (eds.) 
 - Verlag, Berlin  :  Springer ,  2008 
 - xi, 245 p. :  ill. ;  24 cm. 
 - Studies in computational intelligence ;  v. 91 .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783540768302 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pattern recognition systems<br/>Pattern perception<br/>Image processing