Test and diagnosis of analogue, mixed-signal and RF integrated circuits :  the system on chip approach / 
edited by Yichuang Sun 
 - London  :  Institution of Engineering and Technology ,  2008 
 - 389 p. :  ill. ;  24 cm. 
 - Circuits, devices and systems series ;  19 .
<br/><br/><label>ISBN: </label>9780863417450 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Linear integrated circuits--Testing<br/>Mixed signal circuits--Testing<br/>Radio frequency integrated circuits--Testing