Fleetwood,  Daniel M. <br/><br/>
Defects in microelectronic materials and devices / 
edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf 
 - Boca Raton :  CRC Press,  2009 
 - xvi, 753 p. :  ill. ;  26 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781420043761 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics--Materials--Testing<br/>Metal oxide semiconductor field-effect transistors--Testing<br/>Integrated circuits--Defects