00888nam a2200229 a 4500001001400000003000700014005001700021008004100038020001800079040000800097100002600105245013000131260003500261300003400296504005000330650004100380650006400421650003300485700002800518700002900546856008300575vtls000035825KUKTEM20251117145339.0090430t2009    flua   f      001 0 eng d  a9781420043761  aUMP1 aFleetwood,  Daniel M.10aDefects in microelectronic materials and devices /cedited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf  aBoca Raton :bCRC Press,c2009  axvi, 753 p. :bill. ;c26 cm.  aIncludes bibliographical references and index 0aMicroelectronicsxMaterialsxTesting 0aMetal oxide semiconductor field-effect transistorsxTesting 0aIntegrated circuitsxDefects1 aPantelides, Sokrates T.1 aSchrimpf, Ronald Donald.413Table of contents onlyuhttp://www.loc.gov/catdir/toc/ecip0817/2008018722.html