da Silva, Francisco <br/><br/>
The core test wrapper handbook :  rationale and application of IEEE Std. 1500™ / 
by Francisco da Silva, Teresa McLaurin, Tom Waayers 
 - New York :  Springer Science + Business Media ,  2006 
 - 276 p. :  ill. ;  24 cm. 
 - Frontiers in electronic testing ;  35 .
<br/><br/><label>ISBN: </label>9780387307510 0387307516 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Embedded computer systems--Testing--Standards<br/>Systems on a chip--Testing--Standards<br/>Integrated circuits--Testing--Standards